Introduction to Spectroscopic Ellipsometry of Thin Film Materials
Instrumentation, Data Analysis and Applications
By (author) Andrew T. S. Wee By (author) Xinmao Yin By (author) Chi Sin Tang
Paperback (Published)
(April 2022)
ISBN: 9783527349517
6.69 x 9.61 inches
Price: $137.00
On back order
This book serves as an updated summary on the use of Spectrometric Ellipsometry with its practical usage in probing interfacial properties, electronic structures and quasiparticle properties of different classes of thin-film materials.
1. Spectroscopic Ellipsometry: Basic Principles
2. Strongly Correlated Systems: Cuprates & Manganites
3. Two-dimensional Transition Metal Dichalcogenides
4. Single layer graphene systems
5. Nickelate Systems
6. Future Development and Applications of Spectroscopic Ellipsometry
- By (author) Andrew T. S. Wee
- By (author) Xinmao Yin
- By (author) Chi Sin Tang